Invitation to Conferences

November 30th — December 2nd 2020

Online Conference


It is a great honor to welcome you to the XVIIth International Conference on Electron Microscopy (EM’2020). The conference series on electron microscopy was initiated by Professor Stanislaw Gorczyca in 1963. Currently, the Conference is organized every three years by various Polish institutions engaged in the development and application of electron microscopy in cooperation with the Polish Society for Microscopy. This year, the conference is being organized jointly by Silesian University of Technology, Institute of Metallurgy and Materials Science (Polish Academy of Sciences), the Polish Society for Microscopy (PTMi) and Association of Graduates of the Metallurgy and Materials Science of SUT and held on November 30th–2nd December 2020. Due to the COVID-19, for the first time the conference is entirely online. This virtual format gives us exciting opportunities to connect around the world.

The aim of the conference is to present latest achievements in electron microscopy by Polish community as well as plenary and invited speakers representing the most prestigious microscopy labs worldwide. The scientific program of the conference covers a broad spectrum of topics and contains the following sessions: analytical electron microscopy, SEM/STEM imaging, electron crystallography and HRTEM, 3D imaging, in-situ microscopy, orientation mapping, electron microscopy in materials science, electron microscopy in chemistry and life sciences. There is also a special session for young scientists and a poster session. The conference is augmented by a plenary session with lectures given by the top scientists in the world.

The conference would not be possible without the support of the institutions and people of the various communities. We would like to take this opportunity and thank our sponsors: Platinum Sponsor – COMEF, Gold Sponsor – PIK Instruments, Silver sponsor – LABSOFT, and other sponsors – TESCAN and UNI-EXPORT. Moreover, we would like to thank the Polish National Radio Symphony Orchestra and the Silesian Museum in Katowice for the artistic support of the conference.

It is our privilege, the conference is being held under the patronage of Rector of Silesian University of Technology – Prof. PhD. D.Sc. Eng. Arkadiusz Mężyk. A very special word of thanks must be also directed to the members of the Local Organizing Committee and the Scientific Committee who contributed enormously to the success of the present conference. Let us also thank the Dean and administration staff of the Faculty of Materials Science of Silesian University of Technology for their continuous support in the organization of this event.

Finally, we would like to wish you stimulating and rewarding scientific discussions during the conference and the opportunity to make new contacts. Enjoy the coming three days!

Maria Sozańska and Hanna Myalska

Logo PS Logo IMIM Logo PTMI

Invited lectures

Robert Sinclair

Prof. Robert Sinclair

Stanford University, California, USA

Invited lecture titled:

Correlative STEM-EELS and Raman Spectroscopy Studies to Optimize Gold Nanoparticles for Early Cancer Detection

Di Wang

Dr. Di Wang

Karlsruher Institut für Technologie (KIT) Institut für Nanotechnologie, Germany

Invited lecture titled:

Scanning nanobeam electron diffraction for crystalline and amorphous nanostructures

Katja Schladitz

Dr. Katja Schladitz

Fraunhofer Institut für Techno- und Wirtschaftsmathematik (ITWM), Kaiserslautern, Germany

Invited lecture titled:

Reconstruction of porous media from FIB-SEM image stacks

Wolfgang Jaeger

Prof. Wolfgang Jaeger

Institute for Materials Science, Christian-Albrechts-University, Germany

Invited lecture titled:

Advanced and In Situ TEM for Understanding Transport Properties of Semiconductor Interfaces and Nanowires

Ehrenfried Zschech

Prof. Ehrenfried Zschech

Fraunhofer Institute for Ceramic Technologies and Systems (IKTS), Germany

Invited lecture titled:

Multi-scale Microscopy Study of 3D Morphology and Structure of MoNi4/MoO2-Ni Electrocatalytic Systems for Fast Water Dissociation

The XVIIth International Conference
on Electron Microscopy

November 30th — December 2nd 2020. Online Conference

The current global pandemic situation caused by the outbreak of COVID-19 is causing a great amount of uncertainty in general, but to scientific community in particular. We would like to inform you that the planning of the 17th International Conference on Electron Microscopy 2020 is continuing. The Organising Comittee decided to postpone the event, and the Conference will be scheduled for November 30th — December 2nd 2020.

To allow maximum planning flexibility the deadlines were also changed. The new deadlines are given below:

  • Abstract Submission Deadline: October 31st, 2020
  • Notification Due: November 15th, 2020
  • Registration Deadline: October 31st, 2020

If you already have made the reservation at the Hotel Stok, we would like to notify you that all the reservations were rebooked to a new date. The Organising Committee is doing everything possible to make the Conference take place in accordance with the new schedule.

The 11th International Conference on Image Analysis and Stereology in Materials

Important Announcement!

Due to a worldwide situation caused by the outbreak of Coronavirus (COVID-19) and in accordance with legal requirements of the Government of the Republic of Poland we are very sorry to announce that after much discussion and consideration the Organizing Committee of the 11th International Conference on Image Analysis and Stereology in Materials, has decided to CANCEL the STERMAT conference this year.

Many countries and regions recommend self-quarantine and many institutions strongly advising staff, faculty and students to restrict travel, that is why we have settled it is impossible to continue with the STERMAT conference.

In the name of the STERMAT Organizing Committee we advise you to take care of your health and of the ones around you.

The registration fee will be returned to everyone who has already paid it.

Publication: Authors of accepted presentations (oral, poster) are invited to submit their full manuscripts for publication reviewed as journal articles in journals with IF.


The Polish Society for Microscopy has the pleasure to invite you to participate in the XVIIth International Conference on Electron Microscopy.

prof. Maria Sozańska
Silesian University of Technology, Poland

Conference topics

  • Sample Preparation Techniques,
  • Scanning Electron Microscopy (SEM),
  • Advances in SEM and FIB,
  • Transmission Electron Microscopy (TEM),
  • HREM and Novel Techniques,
  • In Situ Microscopy,
  • Electron Diffraction and Crystallography,
  • Electron Backscattering Diffraction,
  • Young Session,
  • Other.



The Organizing Committee of the 11th International Conference on Image Analysis and Stereology in Materials has decided to CANCEL the STERMAT conference this year.

The President of the Polish Society for Stereology
Agnieszka Szczotok, PhD
Silesian University of Technology, Poland

Conference topics

  • Application of stereology and image analysis methods in: material science and engineering, biological materials, medicine,
  • Advances in microscopy,
  • Image processing and analysis algorithms,
  • Theoretical stereology,
  • 3D modeling,
  • Free topics,
  • Young stereologists session,
  • Other.


Register to STERMAT'2020

Register to EM'2020